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ECS Detroit Section: Electron Microscopy of Battery Materials: Crystallographic Ambiguities and Experimental Challenges
Date(s):
April 18, 2024
Venue:Mercedes-Benz Research & Development North America, Inc.
35555 W 12 Mile RD Farmington Hills, MI 48331-3139
Website:Not available
Description:The ECS Detroit Section invites you to Dr. Alpesh Khushalchand
Shukla's in-person presentation, “Electron Microscopy of Battery Materials:
Crystallographic Ambiguities and Experimental Challenges” on April 18 at
Mercedes-Benz Research & Development North America, Inc.
Abstract
Macroscopic degradation of cathode materials in lithium-ion batteries
often begin with microscopic changes and it is important to study pristine and
cycled materials at the atomic level. Electron microscopy is widely used to
characterize battery materials owing to the high spatial resolution it provides
using a variety of imaging, diffraction and spectroscopy techniques. However,
researchers are often faced with ambiguities in structural determination of
these materials due to similarities between various phases present in battery
materials and oversimplifications in interpreting the data. Furthermore, there
are experimental challenges due to the electron beam-sensitive and
air-sensitive nature of many battery materials. In this talk, Dr. Alpesh Shukla
will discuss two examples to demonstrate challenges in structure determination.
For lithium- and manganese-rich lithium transition metal oxides, he will
demonstrate how atomic resolution, HAADF STEM imaging using multiple zone axes
was critical in solving the structure while diffraction provided ambiguous
results. For electrochemically cycled nickel-rich lithium transition metal
oxides, he will show how electron diffraction, including 4D STEM
nanodiffraction mapping helped in correctly identifying the transformed phase
as compared to atomic resolution imaging that exhibited higher amount of
ambiguity. Finally, he will discuss development of tools such as an air-free
transfer in situ TEM holder, an air-free transfer module for FIB/SEM, a
cryo-biasing holder and a continuous rotation tomography holder that were
designed specifically to address experimental challenges in electron microscopy
of air-sensitive and electron beam-sensitive materials.
Student posters
Students are encouraged to present posters. Up to three posters will be
presented at this event. The first three students contacting us about
presenting their work via ecs.detroit.rsvp@gmail.com
will receive $100 and one year of free access to Detroit Section events.
Schedule
1800h Posters and Dinner
1900h Speaker
Fee
Student Presenters: USD $0
Students: USD $10
Professionals: USD $20
Registration includes dinner
Questions
Contact ecs.detroit.rsvp@gmail.com
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Mercedes-Benz Research & Development North America, Inc.
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