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(Print on Demand) Advanced Gate Stack, Source/Drain and Channel Engineering for Si-Based CMOS 3: New Materials, Processes and Equipment – 211th ECS Meeting

(Print on Demand) Advanced Gate Stack, Source/Drain and Channel Engineering for Si-Based CMOS 3: New Materials, Processes and Equipment – 211th ECS Meeting

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$103.00 - (Print on Demand) Advanced Gate Stack, Source/Drain and Channel Engineering for Si-Based CMOS 3: New Materials, Processes and Equipment – 211th ECS Meeting

$82.40 - (Print on Demand) Advanced Gate Stack, Source/Drain and Channel Engineering for Si-Based CMOS 3: New Materials, Processes and Equipment – 211th ECS Meeting

ISBN:9781713819561
Number of pages:470
Year published:2007
Authors/Editors:M. Öztürk, D.-L. Kwong, P. J. Timans, E. P. Gusev, F. Roozeboom, S. J. Koester, H. Iwai
Event Title:211th ECS Meeting: Chicago, Illinois
Format:Print-on-Demand/Softcover
Product Code:T20070601POD
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Proceedings of a meeting held 6-10 May 2007, Chicago, Illinois, USA 211th ECS Meeting
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