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(Print on Demand) Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9

(Print on Demand) Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9

Authors/Editors:Roozeboom, F. et al.
Product Code:t201908903POD

$90.00 - (Print on Demand) Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 $72.00 - (Print on Demand) Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9

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(Print on Demand) Large Scale Energy Storage 10 -and- Battery Safety and Failure Modes

(Print on Demand) Large Scale Energy Storage 10 -and- Battery Safety and Failure Modes

Authors/Editors:Nguyen, T. V. et al.
Product Code:t20190890102POD

$90.00 - (Print on Demand) Large Scale Energy Storage 10 -and- Battery Safety and Failure Modes $72.00 - (Print on Demand) Large Scale Energy Storage 10 -and- Battery Safety and Failure Modes

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Sustainable Materials and Manufacturing 3 (PDF) – 235th ECS Meeting

Sustainable Materials and Manufacturing 3 (PDF) – 235th ECS Meeting

This issue of ECS Transactions includes papers based on presentations from the symposium "Sustainable Materials and Manufacturing 3," originally held at the 235th ECS Meeting in Dallas, Texamore»

Authors/Editors:G. Botte, J. Harb, N. Wu, S. Narayan, E. J. Taylor, A. Manthiram, J. L. Stickney, K. E. Ayers, G. S. Jackson, G. Banerjee
Product Code:T201908907PDF

$48.13 - Sustainable Materials and Manufacturing 3 (PDF) – 235th ECS Meeting $38.50 - Sustainable Materials and Manufacturing 3 (PDF) – 235th ECS Meeting

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2019 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT 7)

2019 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT 7)

This issue of ECS Transactions includes 20 papers presented at the Seventh International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transimore»

Authors/Editors:Y. Kuo
Product Code:T201909001PDF

$86.51 - 2019 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT 7) $69.21 - 2019 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT 7)

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Solid-state Electronics and Photonics in Biology and Medicine 6 (PDF) – 235th ECS Meeting

Solid-state Electronics and Photonics in Biology and Medicine 6 (PDF) – 235th ECS Meeting

This issue of ECS Transactions includes papers based on presentations from the symposium "Solid-state Electronics and Photonics in Biology and Medicine 6," originally held at the 235th ECS Mmore»

Authors/Editors:Y.-L. Wang, Z.-H. Lin, L. F. Marsal, C.-T. Lin, W. Wu, T. Sakata
Product Code:T201908906PDF

$102.57 - Solid-state Electronics and Photonics in Biology and Medicine 6 (PDF) – 235th ECS Meeting $82.06 - Solid-state Electronics and Photonics in Biology and Medicine 6 (PDF) – 235th ECS Meeting

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Wide Bandgap Semiconductor Materials and Devices 20 (PDF) – 235th ECS Meeting

Wide Bandgap Semiconductor Materials and Devices 20 (PDF) – 235th ECS Meeting

This issue of ECS Transactions includes papers based on presentations from the symposium "Wide Bandgap Semiconductor Materials and Devices 20," originally held at the 235th ECS Meeting in Damore»

Authors/Editors:S. Jang, V. Chakrapani, J. Zavada, T. J. Anderson, J. Hite, E. Douglas
Product Code:T201908905PDF

$77.85 - Wide Bandgap Semiconductor Materials and Devices 20 (PDF) – 235th ECS Meeting $62.28 - Wide Bandgap Semiconductor Materials and Devices 20 (PDF) – 235th ECS Meeting

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Processes at the Semiconductor Solution Interface 8 (PDF) – 235th ECS Meeting

Processes at the Semiconductor Solution Interface 8 (PDF) – 235th ECS Meeting

This issue of ECS Transactions includes papers based on presentations from the symposium "Processes at the Semiconductor Solution Interface 8," originally held at the 235th ECS Meeting in Damore»

Authors/Editors:C. O’Dwyer, D. N. Buckley, A. Etcheberry, A. C. Hillier, R. Lynch, P. M. Vereecken, H. Wang, V. Chakrapani
Product Code:T201908904PDF

$74.63 - Processes at the Semiconductor Solution Interface 8 (PDF) – 235th ECS Meeting $59.70 - Processes at the Semiconductor Solution Interface 8 (PDF) – 235th ECS Meeting

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Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 (PDF) – 235th ECS Meeting

Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 (PDF) – 235th ECS Meeting

This issue of ECS Transactions includes papers based on presentations from the symposium "Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Amore»

Authors/Editors:F. Roozeboom, P. J. Timans, K. Kakushima, E. Gusev, Z. Karim, D. Misra, Y. S. Obeng, S. De Gendt, H. Jagannathan
Product Code:T201908903PDF

$90.00 - Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 (PDF) – 235th ECS Meeting $72.00 - Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 9 (PDF) – 235th ECS Meeting

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Large Scale Energy Storage 10 -and- Battery Safety and Failure Modes (PDF) – 235th ECS Meeting

Large Scale Energy Storage 10 -and- Battery Safety and Failure Modes (PDF) – 235th ECS Meeting

This issue of ECS Transactions includes papers based on presentations from the symposia "Large Scale Energy Storage 10," and "Battery Safety and Failure Modes," originally held at the 2more»

Authors/Editors:T. V. Nguyen, T. P. Barrera, J. Nanda, B. Li, W. Wang, P. J. Kulesza, S. D. Minteer, G. Zhang, B. Liaw
Product Code:T20190890102PDF

$90.00 - Large Scale Energy Storage 10 -and- Battery Safety and Failure Modes $72.00 - Large Scale Energy Storage 10 -and- Battery Safety and Failure Modes

No reviews
First International Conference on 4D Materials and Systems

First International Conference on 4D Materials and Systems

This volume of ECS Transactions (ECST) is devoted to the First International Conference on 4D Materials and Systems (4DMS), held August 26-30, 2018, at the Faculty of Engineering at Yamagatamore»

Authors/Editors:A. Khosla, H. Furukawa, K. Fukushima, K. Ito, A. Kakugo, S. Tokito, T. Y. Chu, H. Matsui, F. D. Dos Santos, T. Shiba, H. Ito, A. Nakai, T. Saito, G. Milano, Y. Masubuchi, T. Yoshida, M. White, M. Yanagida, M. Kaltenbrunner, A. Masuhara, S. Bhansali, L. A. Nagahara, P. K. Sekhar
Product Code:T201908801PDF

$149.32 - First International Conference on 4D Materials and Systems $119.46 - First International Conference on 4D Materials and Systems

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