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Event Profile

ECS Detroit Section: Detecting Internal Short Circuit in Li-ion Cells with Sahraei Failure Model

Date(s):
April 7, 2025
Venue:
Mercedes-Benz Research & Development North America, Inc.
35555 W 12 Mile RD
Farmington Hills, MI 48331-3139 
Website:
Not available
Description:

The ECS Detroit Section invites you to “Detecting Internal Short Circuit in Li-ion Cells with Sahraei Failure Model” presented by Elham Sahraei (Temple University) on March 12 at Mercedes-Benz Research & Development North America, Inc.

Student Posters

Students are encouraged to present posters. Up to three posters will be presented at this event. The first three students contacting us about presenting their work via ecs.detroit.rsvp@gmail.com will receive one year of free access to Detroit Section events.

Schedule

1800h Posters and Dinner

1900h Speaker

Fee

Professionals: USD $20

Student presenters: USD $0

Student non-presenters: USD $10

Questions

ecs.detroit.rsvp@gmail.com

  • Individual Registration
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Mercedes-Benz Research & Development North America, Inc.

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