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(Print on Demand) Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7 -plus- Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007) – 212th ECS Meeting

(Print on Demand) Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7 -plus- Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007) – 212th ECS Meeting

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$121.00 - (Print on Demand) Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7 -plus- Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007) – 212th ECS Meeting

$78.60 - (Print on Demand) Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7 -plus- Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007) – 212th ECS Meeting

ISBN:9781713819622
Number of pages:394
Year published:2007
Authors/Editors:D. K. Schroder, L. Fabry, R. Hockett, H. Shimizu, A. Diebold, B. O. Kolbesen, C. L. Claeys, L. Fabry
Event Title:212th ECS Meeting: Washington, DC
Format:Print-on-Demand/Softcover
Product Code:T200701103POD
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Proceedings of a meeting held 7-12 October 2007, Washington, DC, USA. 212th ECS Meeting
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