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Nonvolatile Memories 6 -and- Surface Characterization and Manipulation for Electronic Applications (USB)

Nonvolatile Memories 6 -and- Surface Characterization and Manipulation for Electronic Applications (USB)

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Quick Overview:
This is a pre-order for the USB edition of  ECS Transactions 86-3: Nonvolatile Memories 6 -and- Surface Characterization and Manipulation for Electronic Applications. This issue of ECS Transactions will contain papers based on research presented in both the D04: Nonvolatile Memories 6 and D06: Surface Characterization and Manipulation for Electronic Applications symposia.
 
This issue will be available for pick up at the AiMES 2018 ECS and SMEQ Joint International Meeting, to be held in Cancun, Mexico, September 30 – October 4, 2018. This item will not be shipped.
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ISBN:978-1-62332-528-2
Year published:2018
Authors/Editors:S. Shingubara, Z. Karim, K. Kobayashi, B. Magyari-Kope, H. Shima, Y. Saito, J. G. Park, G. Bersuker, C. Hacker, Y. S. Obeng
Event Title:AiMES 2018
Format:USB/Flash Drive
Product Code:T201808603USB
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This is a pre-order for the USB edition of  ECS Transactions 86-3: Nonvolatile Memories 6 -and- Surface Characterization and Manipulation for Electronic Applications. This issue of ECS Transactions will contain papers based on research presented in both the D04: Nonvolatile Memories 6 and D06: Surface Characterization and Manipulation for Electronic Applications symposia.
 
This issue will be available for pick up at the AiMES 2018 ECS and SMEQ Joint International Meeting, to be held in Cancun, Mexico, September 30 – October 4, 2018. This item will not be shipped.
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